The effect of the graded bilayer design on the strain depth profiles and microstructure of CuW nano-multilayers
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https://zenodo.org/record/5084313
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资源简介：
In this document we share:
-the XRD in-plane scans acquired on Cu/W multilayers at different incidence angle,
-the in-situ stress curvature data acquired during multilayer growth,
-the in plane d-spacing derived at different incidence angle, used for the simulation of the strain gradient.
创建时间：
2021-07-13
