IoT Device RAM Traces For Firmware Attestation
收藏DataCite Commons2024-07-01 更新2024-07-13 收录
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https://ieee-dataport.org/documents/iot-device-ram-traces-firmware-attestation
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资源简介:
This dataset is generated for the purpose of developing and testing attestation techniques for IoT devices. The dataset consists of RAM traces for eight different firmwares including traces for running the legitimate firmware as well as tampered versions of the firmwares. we upload the firmware onto the IoT device and allow it to operate for a predefined time period of 300 seconds. Throughout the device's normal operation, we utilize the gateway node to collect numerous RAM trace samples, each comprising 2048 bytes, with randomized intervals between consecutive samples. These samples are labeled as genuine and preserved for subsequent analysis. Once genuine RAM traces are obtained for all eight device firmware, we proceed by uploading each attack variant of a particular firmware to obtain their corresponding tampered RAM traces. Consequently, we obtain three distinct sets of tampered RAM traces (A_1, A_2, A_3) for each firmware variant.
本数据集专为开发和测试物联网(IoT)设备的可信认证(attestation)技术而构建。数据集涵盖八种不同固件的内存(RAM)跟踪数据,包含合法固件运行时的跟踪记录,以及各固件篡改版本的跟踪数据。我们将固件上传至物联网设备,并令其运行预设时长300秒。在设备正常运行期间,我们通过网关节点采集大量RAM跟踪样本,每份样本大小为2048字节,相邻样本的采集间隔为随机值。上述样本均标注为"正版"并留存,用于后续分析工作。在获取全部八种设备固件的正版RAM跟踪数据后,我们依次上传某一固件的各类攻击变体,以获取对应的篡改RAM跟踪数据。最终,我们为每个固件变体获取了三组不同的篡改RAM跟踪数据集(A₁、A₂、A₃)。
提供机构:
IEEE DataPort创建时间:
2024-07-01
搜集汇总
数据集介绍

背景与挑战
背景概述
该数据集专为物联网设备固件认证技术的开发和测试设计,包含8种不同固件的RAM追踪数据,涵盖合法版本及三种篡改变体(A_1、A_2、A_3)。数据通过物联网设备在300秒运行期间采集,每个RAM追踪样本为2048字节,采样间隔随机,提供了真实与篡改状态的对比样本,支持安全分析研究。
以上内容由遇见数据集搜集并总结生成



