Surface-Topography Challenge_Sample P37
收藏DataCite Commons2025-04-28 更新2025-05-10 收录
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https://contact.engineering/go/rq9mv
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资源简介：
Tapping and contact mode AFM images with different scan sizes on the respective sample P37 (rougher surface-CrN deposited on the rough "backside" of a single-side polished silicon wafer, which has been subsequently etched with isotropic reactive ion etching).
提供机构：
contact.engineering
创建时间：
2025-04-28
