Microstructure profiler raw data (MSS_55_IOW) during leg 3 of the MOSAiC expedition in 2020
收藏Mendeley Data2024-02-17 更新2024-06-27 收录
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https://doi.pangaea.de/10.1594/PANGAEA.939819
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资源简介:
During the MOSAiC drift, vertical profiles of turbulence and auxiliary parameters were measured with MSS microstructure profilers manufactured by Sea and Sun Technology, Germany. Here, the raw binary data from one of in total three different probes deployed during the drift is archived, in the instrument-specific .MRD data format. Every profile is stored in one individual binary file.
创建时间:
2024-02-17



