Medium-definition electron diffraction patterns and their indexation results of a polycrystal Ni sample

This dataset of 33750 medium-resolution (228×320) electron diffraction patterns are acquired from an unstrained polycrystal Ni sample. Traces of scratches are visible in the indexation results. The sample tilt angle is 70°, acceleration voltage 20kV, and the step size 0.61 µm. The indexation results, in format 'mat' of Matlab, by Hough indexation, IDIC6&3 and IDIC-G6&3 are also provided. For each diffraction pattern, 6 parameters calibrated by IDIC and IDIC-G are stocked, i.e. the Euler angle triplet (expressed in radians and with reference to the EBSD detector) and the coordinates of the projection center.