Surface Topography Challenge - Sample P65

The devices used for the challenge were the Whitelight Interferometer and the Keyence VR Microscope. The Keyence VR Microscope used λs at 800μm and λc at 0.8mm as the cutoff parameters. The measurements data used values up to three decimal places. This measurement device performs well with most surfaces but can have issues with measuring surfaces that are reflective. The results showed that the Ra was 0.137μm in the measured area for line roughness.

The Whitelight Interferometer used a 2mm x 2mm area in order to obtain the surface roughness. This area is used for all specimens to ensure repeatability and consistency within the analysis. The data provided for the Whitelight Interferometer will be in an .OPDx file. The results displayed 0.828μm for the Ra.