In situ x-ray diffraction of organic-inorganic hybrid capacitors as a function of electrical poling at different temperatures

Piezoelectric organic-inorganic hybrid capacitors are widely used and intensively studied in order to improve their piezoelectric properties. Anyhow, the internal structure of such devices is not well known at the microscale. Micron X-ray beam allows probing the internal structure by scanning the vertical device direction in order to obtain X-ray diffraction (XRD) in transmission geometry. The aim is to gain information on the structure of the organic matrix, the inorganic particles, and the matrix-electrode interfaces as a function of vertical position and electrical poling at different temperatures for various inorganic particle concentrations and particle surfactants.