Study of SEFI in a 24-bit ADC Using Pulsed Laser

Single Event Functional Interrupt (SEFI) is a phenomenon that arises when high-energy particles collide with sensitive areas of electronic devices in space, which poses a severe threat to the normal operation of spacecraft. Although SEFI research has been conducted on various devices, the research on analog-to-digital converters (ADCs) has received relatively little attention and has only been studied preliminarily. This paper investigates SEFI in a 24-bit ADC with storage units using the precision positioning of pulsed lasers. The experimental results demonstrate that storage unit flipping can cause the ADC output signal to drift or even output zero and that the flipping of configuration and calibration registers inside the ADC has varying effects on the output. Additionally, a new type of SEFI phenomenon caused by an increase in the current of the ADC pin was discovered. This type of SEFI seriously affects the normal operation of the ADC and occurs in multiple areas inside the ADC. This paper proposes preliminary protection measures based on the mechanisms of storage unit flipping, abnormal pin current-induced SEFI, as well as the characteristics of ADC operation. These research results provide valuable insights into the SEFI mechanism of space ADCs and guide ensuring their reliable operation in orbit.