Supplementary Material
收藏aip.figshare.com2024-11-11 更新2025-01-09 收录
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https://aip.figshare.com/articles/dataset/Supplementary_Material/27270501/1
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资源简介：
See the supplementary material for field and temperature dependent leakage current density,
temperature dependent change in polarization, adiabatic temperature change measured at different
temperatures and fields by IR imaging, FE measurement and EC response measured in 1st and 2nd
repeat cycles for BTO single crystal.
请参阅补充材料，以获取关于场和温度依赖性泄漏电流密度、极化度随温度的变化、不同温度和场下的绝热温度变化（通过红外成像、FE测量和EC响应进行测量）、以及BTO单晶在第一和第二次重复循环中的测量结果。
提供机构：
AIP Publishing
