Data from: InGaAs/InAlAs single photon avalanche diode for 1550 nm photons

A single photon avalanche diode (SPAD) with an InGaAs absorption region,
and an InAlAs avalanche region was designed and demonstrated to detect
1550 nm wavelength photons. The characterization included leakage current,
dark count rate and single photon detection efficiency as functions of
temperature from 210 to 294 K. The SPAD exhibited good temperature
stability, with breakdown voltage dependence of approximately 45 mV K−1.
Operating at 210 K and in a gated mode, the SPAD achieved a photon
detection probability of 26% at 1550 nm with a dark count rate of
1 × 108 Hz. The time response of the SPAD showed decreasing timing jitter
(full width at half maximum) with increasing overbias voltage, with 70 ps
being the smallest timing jitter measured.