Crystallographic data collection and refinement statistics.

*Values in parentheses are for highest-resolution shell.
aRmerge = Σh Σi|Ii(h)−<I(h)>/|Σh Σi Ii(h), where I is the observed intensity and <I> is the average intensity of multiple observations from symmetry-related reflections calculated with XDS.
bCorrelation co-efficient value calculated using XDS to determine the resolution cutoff.
cAll values calculated using REFMAC. Rwork = Σh||Fo|h−|Fc|h|/Σh|Fo|h, where Fo and Fc are the observed and calculated structure factors, respectively. Rfree computed as in Rwork, but only for (5%) randomly selected reflections, which were omitted in refinement.