Limits of Deep Learning in Monitoring the Degradation Process
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These codes belongs to the followig paper: T. Berghout and W. H. Lim, "Deep Learning and Machine Life: A Critical Empirical Perspective — Introducing Phase-Shift Degradation Analysis in Prognostics," 2025 22nd International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE), Mexico City, Mexico, 2025, pp. 1-6, doi: 10.1109/CCE67728.2025.11271957.
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Zenodo创建时间：
2025-05-05
