Measurement method and Built-In Self-Test (BIST) circuit architecture exploiting Compressive Sampling for frequency response characterization of Digital-to-Analog Converters
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https://ieee-dataport.org/documents/measurement-method-and-built-self-test-bist-circuit-architecture-exploiting-compressive
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资源简介：
Measurement method and Built-In Self-Test (BIST) circuit architecture exploiting Compressive Sampling for frequency response characterization of Digital-to-Analog Converters
提供机构：
TUDOSA, IOAN
创建时间：
2020-08-04
