Comparison of pseudo XRR and XRR from conventional reflectometry: water

measurement from the same water surface using GIXOS and conventional reflectometry. Pseudo reflectivity (pseudo XRR) is derived from GIXOS data using the extended Capillary Wave Model, with the exact same rectangular slit setting of the reflectometry and taking into account how reflectivity background is subtracted. Data was measured at the OPLS endstation of the beamline 12ID-SMI, NSLS-II of the Brookhaven National Laboratory.