CIGS Experimental and SCAPS Data
收藏DataCite Commons2022-01-28 更新2025-04-16 收录
下载链接：
https://ieee-dataport.org/documents/cigs-experimental-and-scaps-data
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资源简介：
This dataset contains simulated and experimental data for CIGS devices with and without RbF post-deposition treatment. The experimental results include full dark and light current-voltage curves from 150K to 350K. It also includes diode parameters calculated from these curves at 300K. The simulated results include SCAPS simulated Voc values over a range of defect concentrations for the Ev+0.58eV, Ev+0.98eV, and bandtail defects.
提供机构：
IEEE DataPort
创建时间：
2022-01-28
