Scanning electron microscopy (SEM) images of the boron-doped carbon nanowalls surfaces
收藏Most Wiedzy Open Research Data Catalog2026-04-17 收录
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The dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of boron-doped carbon nanowalls electrodes on silicon substrates. The surface is characterized by nano-walled structures. The obtained electrodes were doped with boron at the level of [B]/[C] = 5000ppm in the gas atmosphere during the synthesis. The selected micrographs were utilized when preparing the manuscript published in Acta Materialia: DOI 10.1016/j.actamat.2021.116989
提供机构：
Mateusz Ficek
