SOC410 reflectance measurements
收藏DataCite Commons2024-09-05 更新2024-07-13 收录
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资源简介：
Reflectance measurements in 6 spectral bands spreading from the shortwave to the thermal infrared acquired using a SOC410-DHR handheld reflectometer.
The objective was to collect a large set of material samples representative of the urban lansdscape.
Some measurements were performed simultaneously over the same samples with a spectroradiometer (ASD) or a CIMEL thermal radiometer.
The SOC410 measures the reflectance for two view angles (20 and 60°) and in 6 spectral bands:
- 0.9-1.1 microns
- 1.9-2.4 microns
- 3.0-3.9 microns
- 3.0-5.0 microns
- 4.0-5.0 microns
- 8.0-12.0 microns
More detailled caracteristics can be found here:
https://surfaceoptics.com/wp-content/uploads/2020/11/410-DHR-Datasheet.pdf
Pictures are available for some of the samples. Check the README file to get more information on the data organisation and characteristics.
提供机构：
Theia
创建时间：
2023-02-13
