An energy dispersive X-ray fluorescence method for screening grain calcium, zinc, iron, manganese, and copper in wheat

This dataset contains multi-element concentration measurements for wheat (Triticum aestivum L.) grain samples collected from diverse genotypes used to calibrate and validate an energy-dispersive X-ray fluorescence (EDXRF) method. The dataset includes elemental concentrations for calcium (Ca), manganese (Mn), iron (Fe), copper (Cu), and zinc (Zn), with values generated using both EDXRF (non-destructive estimates) and a microwave plasma–atomic emission spectrometer (MP-AES) as reference measurements. Data are organized by genotype (sample_id), sample group (calibration or validation), and analytical method (MP-AES or EDXRF), with corresponding elemental concentration values (mg kg⁻¹). These data enable a comparative assessment of elemental methods and studies related to crop biofortification and nutrient phenotyping. The dataset is particularly relevant for researchers working on high-throughput screening methods in plant breeding programs.
, , # Data from: An energy dispersive X-ray fluorescence method for screening grain calcium, zinc, iron, manganese, and copper in wheat

Dataset DOI: [10.5061/dryad.rjdfn2zq4](10.5061/dryad.rjdfn2zq4)

## Description of the data and file structure

A total of 70 wheat (Triticum aestivum L.) genotypes were used for calibration (n = 29) and validation (n = 41) of EDXRF for Ca, Mn, Fe, Cu, and Zn. An MP-AES 4200 (Agilent Technologies, Santa Clara, CA, USA) was used as the reference method. The EDXRF used in this study was the Epsilon 4 (Malvern Panalytical, Worcestershire, United Kingdom). All samples were measured in duplicate except three standards, which had an additional measurement (e.g., a third replicate) included in the dataset to improve estimates. Consequently, the third‑replicate column (mpaes_3) contains NA (not available) values for all other samples.

### Files and variables

#### File: EDXRFDataForRepository_Calibration.csv

**Description:** Raw data of the calibration set measu..., ,