X-ray crystallography statistics.
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https://figshare.com/articles/dataset/_X_ray_crystallography_statistics_/696650
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*Values in parentheses are for the highest resolution shell.
†Rsym = Σ|I-|/Σ, where I is the observed intensity, and is the average intensity of multiple observations of symmetry related reflections.
‡R = Σhkl∥Fobs|−|Fcalc∥/Σhkl|Fobs|.
§Rfree calculated from 5% of the reflections excluded from refinement.
创建时间：
2013-05-02
