SBGBBG, a program to evaluate the macroscopic strain/stress tensor of a polycrystalline sample from X-ray reflection positions

Abstract
The evaluation of the strain/stress tensor from strain measured by X-ray diffraction requires a transformation from the sample system S to the laboratory system L. The transformation matrix A depends on the diffractometer geometry and the sample tilting. The conversion from strain to stress relies on poly-crystal elastic compliances S′_(mnop). The averaging is done about the orientation of the diffracting crystallites. The orientation distribution function (ODF) serves as weighting function...

Title of program: SBGBBG
Catalogue Id: ADAF_v1_0

Nature of problem
Residual stresses in a polycrystalline sample cause changes in lattice plane distances which result in a shift of the X-ray reflections. The reflection shift depends on the measurement direction within the sample and therefore we can utilize the shift to evaluate the residual stress, i.e. the stress tensor.

Versions of this program held in the CPC repository in Mendeley Data
ADAF_v1_0; SBGBBG; 10.1016/0010-4655(94)00128-O

This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)

摘要
对通过X射线衍射测得的应变进行应变张量评估，需要将样本系统S转换为实验室系统L。转换矩阵A取决于衍射仪几何形状和样本倾斜。应变到应力的转换依赖于多晶弹性柔量S'_(mnop)。平均过程以衍射晶粒的取向为基准进行。取向分布函数（ODF）作为加权函数...

程序名称：SBGBBG
目录编号：ADAF_v1_0

问题性质
多晶样品中的残余应力会导致晶格平面距离发生变化，从而引起X射线反射的偏移。反射偏移取决于样本内部的测量方向，因此我们可以利用偏移来评估残余应力，即应力张量。

此程序版本存放在Mendeley数据中的CPC软件库中
ADAF_v1_0; SBGBBG; 10.1016/0010-4655(94)00128-O

该程序已从贝尔法斯特女王大学（1969-2019年）所持有的CPC程序库中导入。