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Twisted MoS2 Bilayers as Functional Elements in Memtransistors: Hysteresis, Optical Signatures, and Photocurrent Kinetics Dataset

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Zenodo2025-10-10 更新2026-05-26 收录
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# MoS₂ under Electrical Stress — Raw & Processed Data (v1.0.0) **Project:** Strain and Charge Carrier Density Shift in Monolayer MoS₂ under Electrical Stress **License:** Data — CC BY 4.0 --- ## Scope This archive contains **raw** and **processed** datasets used to generate the figures and tables in the manuscript. It covers:- Raman/PL spectra and maps under bias (1L, 2H‑2L, and twisted bilayer 2L‑t regions)- Electrical sweeps (Ids–Vgs/Vds) and hysteresis metrics- Photocurrent maps and time‑resolved kinetics- Per‑figure “**figure_source**” CSVs that reproduce each panel without additional processing --- ## Collection conditions and instruments - **Substrate/back gate:** 90 nm SiO₂ on Si (\(C_{\mathrm{ox}} \approx 3.84\times10^{-8}\,\mathrm{F\,cm^{-2}}\); \(C_{\mathrm{ox}}/q \approx 2.39\times10^{11}\,\mathrm{cm^{-2}\,V^{-1}}\)). - **Optics:** 532 nm excitation; objective NA 0.8; spectrometer Horiba LabRAM. - **Electrical:** Keithley 4200‑SCS; sweep rates and compliance logged per file. --- ## File formats and conventions - **Encoding:** UTF‑8. - **Delimiters:** `.csv` and `.txt` are **tab‑separated**; decimals use **dot** (`.`). If raw instruments used decimal commas, they are preserved in `RAW/` but normalized in `PROCESSED/`. - **Units:** Declared in the header row; base SI (e.g., `Iph_A`, `power_W`, `x_um`). - **Missing values:** `NaN`. - **Time bases:** seconds unless stated. --- ## Provenance and reproducibility Processed data are generated with the following notebooks (archived in the companion code release):- `Raman_PL_mapping.ipynb` → exciton/trion fits, strain (ε) and carrier density (n) maps - `Photocurrent_mapping.ipynb` → photocurrent maps, kinetics, α‑vs‑power tables - `All_devices_electrical_chartacterization.ipynb` → Ids–Vgs/Vds parsing, hysteresis metrics, figure tables - `Mobility_extraction.ipynb` → mobility (μ_FE), threshold voltage (V_TH), related metrics Exact parameters (fit windows, smoothing, Grüneisen table, segmentation) are logged into each output header.

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2025-10-10
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