Local structure analysis of 300 keV He+ irradiated REBCO coated conductor using polarisation dependent Cu K edge EXAFS
收藏DataCite Commons2024-11-08 更新2025-04-16 收录
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https://ora.ox.ac.uk/objects/uuid:1f5d7892-38d6-4bfe-bebb-59f31d398e96
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资源简介：
XAS measurements collected on the I20-Scanning beam line at Diamond Light Source, and XRD measurements collected using a Malvern Panalytical Empyrean X-ray kit with a Cu tube.
提供机构：
University of Oxford
创建时间：
2024-11-08
