Exploration of the elemental analysis with negative muons in thin-film layers

Probing the elemental composition of thin-film layers with non-destructive methods is a serious challenge that has not yet a real answer. Negative muons have this capability,...采用非破坏性方法探测薄膜层的元素组成，是一项至今尚未拥有有效解决方案的重大挑战。负μ子（negative muon）恰好具备此类探测能力，……