High energy characterization of interface for quantum applications

We will use the new set of lenses to focus the beam to submicron size and then perform the novel High-Enrgy X-Ray Reflectivity Tomography on different sample我们将采用新型透镜组将光束聚焦至亚微米级尺寸，随后对不同样品开展新型高能X射线反射层析成像（High-Energy X-Ray Reflectivity Tomography）。