High-definition electron diffraction patterns and projection center calibration results of a polycrystal Al-Mg sample at multiple detector distances

This dataset consists of four sets of high-resolution (1140×1600) electron backscatter diffraction (EBSD) patterns acquired from the same region of an unstrained polycrystalline Al-Mg alloy. The diffraction patterns were recorded using a Bruker eFlashHD camera mounted on a Tescan MAIA2 SEM. The sample-detector distances were intentionally varied among 18 mm, 22 mm, 26 mm, and 30 mm. For each detector position, 1200 patterns were captured with a step size of 3.43 µm, a beam current of 20 nA, and a dwelling time of 0.3 s. The detector tilt angle was set to 70°. The dataset enables comparative calibrations using several methods, including the hardware-based screen-moving technique (method T) and the software-based techniques with simulated master patterns (method S, method G, method Mf, method Mc). For each diffraction pattern, the calibrated crystal orientation (coded as Euler angles) and projection center coordinates by these five methods are provided.