Evaluation of the content of zinc compounds in polyethylene films using scanning electron microscopy

The dataset contains the results of in the form of micrographs made using a scanning electron microscope (SEM) S–3400N (Hitachi, Hyogo, Japan) using backscattered electron (BSE) detector. SEM was equipped with tungsten filament. The accelerating voltage was 25 kV. Utilization of BSE detector allowed to increase the contrast of local areas varying in the material’s chemistry and/or density. The obtained results allowed the assessment of the distribution of zinc compounds in polyethylene films.