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Supporting data for the article "Charge-Induced Artifacts in Nonlocal Spin-Transport Measurements: How to Prevent Spurious Voltage Signals"

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Zenodo2022-08-10 更新2026-05-25 收录
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Supporting data for the article "Charge-Induced Artifacts in Nonlocal Spin-Transport Measurements: How to Prevent Spurious Voltage Signals" If the design files are used to reproduce the current source, we ask to cite the peer-reviewed publication of our work in any publication in which the adjustable virtual ground feature is used for measurements. We provide the following data and design files: 1.) Data used to create each figure both in the main manuscript and the supplementary material in the zip-folder "Data presented in figures".<br> The data is provided in two formats:<br> I.) Raw data in freely accessible file formats such as .dat, .txt, or .csv.<br> II.) Graphically processed data (figures as shown in the publication) in the proprietary file format .opju. Used program: OriginPro 2019 2.) LTspice models in the zip-folder "LTspice models". The simulations were conducted with LTspice version XVII(x64). 3.) Altium Designer files of the current source in the zip-folder "Altium Designer files". 4.) Gerber X2 and NC drill files (dimensions in millimeters) for the manufacturing of the PCB that is used in our project in the zip-folder "Fabrication files". See the readme file in the directory for more information on the fabrication process. 5.) A bill of materials.

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2022-07-14
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