raw data for doping interface analysis JACS 2019_original.zip
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下载链接:
https://archive.data.jhu.edu/file.xhtml?persistentId=doi:10.7281/T1/3XLWZX/LXLGDY
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资源简介:
Measured data points producing plots of currents and voltages through the silicon transistor gated through the dopant solution, plus spectroscopic data
提供机构:
Johns Hopkins University Data Archive
创建时间:
2019-03-14



