Crystallographic analysis of GFLV particles.
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£Statistics are given for reflections with I> = 0 and values in parentheses are for the highest resolution shell.†Rmerge = σhkl σi |Ii(hkl) - I(hkl)>|/σhkl σi Ii(hkl).#The high R-factor can be explained, among other reasons, by the model used (a low resolution EM reconstruction, without filtering) and the absence of a bulk solvent correction.*The cross-validation (R-free) was calculated with 5% of the data.**ADPs: Atomic displacement parameters.
创建时间：
2015-12-02
