Measured compositions of layers and comparison with models (Fig. 4 data); measured strains of layers and comparison with models (Fig. 6 data); measured gallium profiles near interfaces with buffer lay
Light intensity data recorded during the anodization of aluminum monocrystal. Light source: SLS201L/M (ThorLabs). Spectrometer: USB4000 (OceanOptics). Spectra acquisition software: SpectraSuite
