Short Lifetime Components In The Relaxation Of Boron Acceptors In Silicon
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The data is that described in 'Short lifetime components in the relaxation of boron acceptors in silicon’, K. Saeedi et al, Physical Review B (2018). The data consists of the probe transmission as a function of time delay in each case. The different experiments are labelled according to the figure in which they occur in the main paper. The data are raw and have not been smoothed or otherwise processed. The data is in an Origin file format. Please contact the author for data in other formats.
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Zenodo创建时间：
2018-03-11
