X, Y Displacement In Minilm

Name: X, Y Displacement In Minilm
Creator: Electron Microscopy Science Technology Platform, The Francis Crick Institute, 1 Midland Road, London NW1 1AT, UK
Published: 2016-12-02T00:00:00+08:00

Zenodo2016-12-02 更新2026-04-07 收录

电子显微镜定位校准

切片间抖动分析

数据链接：

https://zenodo.org/record/192294 数据链接链接失效反馈

官方服务：

资源简介：

X, Y landmark positions from miniLM mounted in Gatan 3View SBF-SEM. The difference between each point gives the slice-to-slice jitter in the positioning of the microscope. Scale 0.376 µm per pixel.

提供机构：

Electron Microscopy Science Technology Platform, The Francis Crick Institute, 1 Midland Road, London NW1 1AT, UK

创建时间：

2016-12-02

X, Y Displacement In Minilm

资源简介：

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