Research data supporting: "Electrolyte-gated organic field-effect transistors with high operational stability and lifetime in practical electrolytes"

This repository entry contains research data supporting "Electrolyte-gated organic field-effect transistors with high operational stability and lifetime in practical electrolytes".

Electrolyte-gated field-effect transistor (EG-OFET) and organic field-effect transistor (OFET) data:

The “Origin project files” folder contains mostly organic field effect transistor (OFET) and electrolyte-gated organic field-effect transistor (EG-OFET) data (I-V and I-time curves). The OFETs and EG-OFETs were electrically characterized in ambient conditions using an Agilent 4156C Semiconductor Parameter Analyzer (SPA) with high resolution source-meter units and a current resolution of 1 fA. We measured in continuous mode with a long integration time of 0.04 sec. The Origin scripts used to analyze the I-V and I-time curves can be found in the OE-FET GitHub repository. OriginLab Origin Pro is required to view the processed data in the "Origin project files" folder, as well as to run the Origin scripts for the analysis of the transistor I-V and I-time curves. The .csv files are contained inside the Origin project files.

Fourier-transform infrared spectroscopy (FTIR) data:

The "FTIR" Origin project file contains the FTIR spectra used in the publication. The FTIR spectra were collected in transmission geometry on a Bruker Vertex 70v under vacuum (<2 mbar) using a wide-range DLaTGS detector. Instrument resolution was set to 4 cm-1, and scan rate of 2.5 kHz and 5 mm aperture was used. The FTIR spectra were exported to csv files from OPUS. They were filtered to remove etalon reflections from the substrate using a finite impulse response bandstop filter comb generated by the MATLAB Filter Designer package. They were then plotted with Origin.

X-ray photoelectron spectroscopy (XPS) data:

The "XPS" Origin project file contains the X-ray photoelectron spectroscopy (XPS) data used in the publication. The XPS analysis was carried out using an Escalab 250XI spectrometer from Thermo Fisher Scientific (West Sussex, UK). The instrument was operating in constant analyzer energy mode. A monochromatic Al-Kα source (1486.74 eV) and a flood gun for charge neutralization were used. Narrow scans were recorded using a 500 μm spot size, a pass energy of 30 eV, a step size of 0.05 eV, and a dwell time of 50 ms. For the depth profiling, an Ar+ gun operating at 3000 eV and high current mode was used. The raster area was 1.5 mm. The CASA XPS software was used to get the quantification of each element.

Designs:

This folder contains the CAD design files used in this publication. They were designed using AutoCAD Inventor. The “Advanced Microfluidics SPM OEM pump casing” folder contains the CAD design files for the casing of the SPM OEM pump. The “Clamp” folder contains the CAD design files for the PMMA clamp used to clamp the EG-OFET.

Sensitivity, LOD, LOQ calculations:

This file contains the sensitivity, limit of detection (LOD), and limit of quantification (LOQ) calculations for Figure S26.

Stability metrics:

This file contains the calculations for the stability metrics shown in Table S1. These calculations are derived from the data shown in Figure 4.

本仓库条目包含支持“基于电解质门控的有机场效应晶体管在实用电解质中具有高操作稳定性和寿命”的研究数据。

电解质门控场效应晶体管（EG-OFET）和有机场效应晶体管（OFET）数据：
“起源项目文件”文件夹主要包含有机场效应晶体管（OFET）和电解质门控有机场效应晶体管（EG-OFET）数据（I-V 和 I-时间曲线）。OFET 和 EG-OFET 在环境条件下使用 Agilent 4156C 半导体参数分析仪（SPA）进行电学表征，该分析仪配备了高分辨率源测量单元和 1 fA 的电流分辨率。我们以连续模式进行测量，积分时间为 0.04 秒。用于分析 I-V 和 I-时间曲线的 Origin 脚本可在 OE-FET GitHub 仓库中找到。要查看“Origin项目文件”文件夹中的处理数据以及运行分析晶体管 I-V 和 I-时间曲线的 Origin 脚本，需要使用 OriginLab Origin Pro。.csv 文件包含在 Origin 项目文件中。

傅里叶变换红外光谱（FTIR）数据：
“FTIR”Origin 项目文件包含用于发表的 FTIR 光谱。FTIR 光谱在 Bruker Vertex 70v 的传输几何下收集，该设备在真空条件下（<2 mbar）使用宽范围 DLaTGS 检测器。仪器分辨率设置为 4 cm-1，扫描速率为 2.5 kHz，孔径为 5 mm。FTIR 光谱从 OPUS 导出为 csv 文件。使用由 MATLAB Filter Designer 软件包生成的有限脉冲响应带阻滤波器组合去除基底上的etalon 反射。然后使用 Origin 绘制。

X射线光电子能谱（XPS）数据：
“XPS”Origin 项目文件包含用于发表的 X射线光电子能谱（XPS）数据。XPS 分析使用 Thermo Fisher Scientific（英国西苏塞克斯）的 Escalab 250XI 光谱仪进行。仪器在恒定分析器能量模式下运行。使用单色 Al-Kα 源（1486.74 eV）和电荷中和用的 flood 枪。使用 500 μm 光斑大小、30 eV 的通过能量、0.05 eV 的步长和 50 ms 的停留时间记录窄扫描。对于深度剖析，使用 3000 eV 和高电流模式操作的 Ar+ 枪。扫描区域为 1.5 mm。使用 CASA XPS 软件获取每个元素的量化。

设计：
此文件夹包含本出版物中使用的 CAD 设计文件。它们使用 AutoCAD Inventor 设计。包含“Advanced Microfluidics SPM OEM 泵外壳”文件夹的 CAD 设计文件用于 SPM OEM 泵的外壳。包含“夹具”文件夹的 CAD 设计文件用于夹紧 EG-OFET 的 PMMA 夹具。

灵敏度、检测限（LOD）、定量限（LOQ）计算：
此文件包含图 S26 的灵敏度、检测限（LOD）和定量限（LOQ）计算。

稳定性指标：
此文件包含表 S1 中所示稳定性指标的计算。这些计算来自图 4 中所示的数据。