Role of Chalcogen atoms in In-Situ Exfoliation of Large-Area 2D Semiconducting Transition Metal Dichalcogenides

Datasets for "Role of Chalcogen atoms in In Situ Exfoliation of Large-Area 2D Semiconducting Transition Metal Dichalcogenides" publication. Optical microscopy, atomic force microscopy (AFM), low-energy electron diffraction (LEED) and X-ray photoelectron spectrocopy measurements (XPS). Measurements were conducted at the Zernike Institute for Advanced Materials in Groningen, The Netherlands. All measurements were performed at room temperature. LEED measurements are obtained using electron energy of 125 eV, while XPS measurements were performed using photon energy of 1486.6 eV (Al anode). Experimental data are provided in jpeg format (optical microsopy images, LEED data), spm (AFM data) and txt (XPS data).