X-Ray Fluorescence and Reflectography Data from Munich, Staatsarchiv München ...
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https://b2find.eudat.eu/dataset/ae5b4cd9-1117-5737-8d57-67b0fd8a4d27
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资源简介：
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Staatsarchiv...
