Dataset for Single Carrier Trapping and Detrapping in Scaled Silicon Complementary Metal-Oxide-Semiconductor Field-Effect Transistors at Low Temperatures
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下载链接：
https://eprints.soton.ac.uk/403188/
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资源简介：
Dataset supporting:
Li, Zuo et al (2017) Single Carrier Trapping and Detrapping in Scaled Silicon Complementary Metal-Oxide-Semiconductor Field-Effect Transistors at Low Temperatures. IOP nanotechnology.
提供机构：
University of Southampton
创建时间：
2017-05-18
