Master 2 Practical : Investigation of Si bonding interfaces with X-ray reflectivity
收藏ESRF Portal2025-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-1005233327
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资源简介：
The purpose of the experiment is to perform a practical with M2 students of the UGA. The topic of the practical will be the investigation of bonding interfaces in Si wafer using X-ray reflectivity.
提供机构：
Jean-Sebastien MICHA; Léo-Malik BENNEKA
创建时间：
2025-01-01
