Replication Data for: Impact of Bulk Conduction Phenomena on the Temporal Stability of Piezoelectric Behaviour of Engineered PDMS Ferroelectrets

This dataset contains experimental measurements related to the electrical properties of ferroelectret and PDMS (polydimethylsiloxane) films, including piezoelectric, dielectric, and conduction characteristics under various conditions. The data covers:
<ul>
<li><b>Piezoelectric d33 Coefficient Stability:</b> Time-dependent measurements for ferroelectrets of different thicknesses (600–1400 μm) poled at 5 and 6 MV/m.</li>

<li><b>Surface Potential and Conductivity:</b> Measurements of conductivity versus surface potential for PDMS films charged via impulse and corona methods, along with the apparent distribution of charge traps below the conduction band.</li>

<li><b>Surface Potential Decay:</b> Analysis of decay rates versus surface potential for impulse and corona-charged PDMS films, including log-log representations at different initial potentials.</li>

<li><b>Polarization-Electric Field Characteristics:</b> First and fifth voltage loop measurements for polypropylene and PDMS ferroelectrets of varying thicknesses (600–1400 μm), including comparisons between ferroelectrets and unstructured PDMS films.</li>

<li><b>Charge Transport Behavior:</b> Current flow through PDMS films of 200–600 μm thickness under electric fields of 0.5, 4, and 8 MV/m, along with apparent bulk resistivity analysis at these fields.</li>

<li><b>Surface Potential Decay Filtering:</b> Normalized and filtered decay data for 1 mm thick PDMS films charged using different methods.</li></ul>