Data from: Does 1,8-Diiodooctane affect the aggregation state of PC71BM in solution?

Spin coated ellipsometry thickness measurementsThese are ellipsometry thickness measurements for the spin coated films after they were spin coated for the PC71BM fullerene thin films after spin coatingSpin coated PC71BM fullerene ellipsometry data.xlsxOptical microscopy dewetted imagesOptical images of the PC71BM fullerene films processed with 3 % (v/v) DIO. The folder contains an image of the graticule used where 1 teil is 0.01 mm.SAXS dataSaxs data scaled by transmission but not thickness. The optical images of the capillaries are included for each capillary. The log book detailing which run is which capillarySANS_2Log book with file designations and descriptions. Mask file, empty cell, empty beam and sample measurementsIn situ spin coatingIn situ spin coating measurements, intensity change as a function of time along with the thickness change as a function of timrHigh q (0.8 m SAXS data and SasView Guinier fits)This contains the high q SAXS taken at at 0.8 m along with the sample designation. The extracted data from the Lou et al paper is also included. Fits to all four of the SAXS data using SasView 4.1high q SAXS data and fitting.zipSANS measurement of PC71BM in carbon disulfideSANS measurements taken on the instrument Loq, with the same concentration of 15 mg/ml in the solvent carbon disulfide.SANS PC71BM cd.zip