4D-STEM characterization results from a thermal annealing series of poly(3[2-(2-methoxyethoxy)ethoxy]- methylthiophene-2,5-diyl) organic electrochemical transistor films

Name: 4D-STEM characterization results from a thermal annealing series of poly(3[2-(2-methoxyethoxy)ethoxy]- methylthiophene-2,5-diyl) organic electrochemical transistor films
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Published: 2024-09-24 11:11:08
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NIST Chemistry WebBook2024-09-24 更新2026-03-14 收录

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https://data.nist.gov/od/id/mds2-3060

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This repository contains two types of datasets: 4D-STEM data collected from a thermal annealing series of P3MEEMT films.