EML芯片的工作波长数据

50G EML芯片的主流工作波长数据主要用于表征电吸收调制激光器芯片的光谱特性及其外延一致性。50G速率等级的EML芯片广泛应用于光通信中的O-band（1310 nm）窗口，其工作波长的稳定性与分布特征直接影响器件的调制性能、系统波分复用兼容性以及整体传输质量。该数据集记录了50G EML芯片在典型工作条件下的主模波长信息。数据采集在温度（50±3）℃、湿度（55±5）%RH的洁净实验室环境中进行，采用高分辨率光谱分析仪对芯片光谱输出进行精确测试。在测试过程中，对器件施加60 mA恒定工作电流，采集其稳态发光谱线，并提取输出光谱中主模峰值位置作为工作波长数据。该数据集可广泛应用于EML芯片外延质量监测、波长漂移模型研究、温度依赖性分析及光通信系统参数匹配等研究领域。数据量为5.5MB。The mainstream operating wavelength dataset of 50G electroabsorption modulated laser (EML) chips is primarily used to characterize the spectral properties and epitaxial consistency of these devices. 50G-rate EML chips are widely deployed in the O-band (1310 nm) window of optical communications, and the stability and distribution characteristics of their operating wavelengths directly affect the modulation performance of the devices, wavelength-division multiplexing (WDM) compatibility of the system, and overall transmission quality. This dataset records the main mode wavelength information of 50G EML chips under typical operating conditions. Data collection was conducted in a clean laboratory environment with a temperature of (50±3) ℃ and humidity of (55±5)% RH. A high-resolution optical spectrum analyzer was used to accurately test the spectral output of the chips. During the testing process, a constant operating current of 60 mA was applied to the devices, their steady-state emission spectra were collected, and the peak position of the main mode in the output spectrum was extracted as the operating wavelength data. This dataset can be widely applied in research fields including EML chip epitaxial quality monitoring, wavelength drift model research, temperature dependence analysis, and optical communication system parameter matching. The total size of this dataset is 5.5 MB.

搜集汇总

背景与挑战

背景概述

该数据集记录了50G EML芯片在典型工作条件下的主模波长信息，用于表征电吸收调制激光器芯片的光谱特性和外延一致性。数据采集于特定温湿度环境，采用高分辨率光谱分析仪进行精确测试，适用于光通信O-band窗口的器件监测和系统参数匹配研究。