Demonstration of proof-of-concept experiment for x-ray quantum interferometers

We propose a proof-of-concept experiment to demonstrate the ability to use x-ray quantum nonlinear interferometers for precise phase sensing. The interferometer is based on the effect of parametric down conversion (PDC) in a monolithic double Laue silicon structure. Quantum interferometers have much higher sensitivity than classical interferometers as has been demonstrated by experiments with visible light and predicted by theory, hence can lead to the development of phase contrast imaging methods for the measurements of samples with refractive index contrasts much smaller than the capabilities today. The experiment will advance the field of x-ray quantum optics and open possibilities for the development of quantum technologies with x-rays.