Dataset on Antibacterial performance of lead-free brass: The role of microstructure refinement and passive layers chemical composition SONATA BIS 11 2021/42/E/ST5/00118

<p style="text-align:justify">The study presents a dataset of X-ray diffraction (XRD) and  X-ray photoelectron spectroscopy (XPS)  for annealed (AN) and high-pressure torsion (HPT) processed CuZn21Si3P samples. It also contains an electron beam scattered diffraction (EBSD) data gathered for AN (cross-section), HPT-processed and annealed at 200°C for 1 h (longitudinal section), HPT-processed and annealed at 400°C for 1 h (longitudinal section), and HPT-processed and isochronally annealed (cross-section) CuZn21Si3P samples.</p><p style="text-align:justify">XRD analysis was performed using a Bruker D8 Advance diffractometer equipped with Cu Kα radiation (λ &#61;1.5406 Å).XPS spectra were acquired using a Microlab 350 spectrometer (Thermo Electron) at the Institute of Physical Chemistry Polish Academy of Sciences. The analyses were carried out with a non-monochromatic AlKα source with an energy of 1486.6 eV and a power of 300 W. The phase composition of AN (cross-section), HPT200 (longitudinal section), HPT400 (longitudinal section), and HPT-processed after isochronal annealing (cross-section) samples was assessed using a SEM Hitachi SU70 equipped with EBSD detector Bruker e-Flash. For samples at ×500 magnification, data were collected from 43200 measurement points with a step size of 1.06 μm; for ×1500 magnification, data were collected from 67 500 measurement points with a step size of 0.28 μm.<br /><br /></p>