Data for "Even-Odd Layer-Dependent Exchange Bias Effect in MnBi2Te4 Chern Insulator Devices"
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Raw data for "Even-Odd Layer-Dependent Exchange Bias Effect in MnBi2Te4 Chern Insulator Devices". These are all the data in the main text and the supplementary materials. The opj files are the processed Origin data.
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Zenodo创建时间：
2025-04-16
