Single crystal x-ray diffraction of Ta2NiS5 at low temperature.

Single crystal x-ray diffraction of Ta2NiS5 were performed at ID15B. The sample was mounted with Apiezon N grease on a 300 μm thick diamond plate and cooled with a home made Helium flow cryostat to 2.4 K. Monochromatic x-rays with a wavelength of 0.41 Angstorms were used, with a spot size of 4 × 4
μm. Data were collected through continuous ϕ-rotation over a range of 70 degrees, with shutterless readout at intervals of 0.5 degrees. For the data acquisition an EIGER2 X CdTe 9M detector (Dectris, Switzerland) was employed. The scattering geometry was calibrated with a natural vanadinite single
crystal. The detector distance from the sample was 179.600 mm. The data set 'E1_2p4K' contain the measurement of the sample at 2.4 K and the dataset 'vana' the calibration of the geometry at room temperature.