X-ray diffraction data of adhesive tapes for the top dusted sample preparation method

The top-dusted method is one approach to prepare small-volume powder samples for the X-ray diffraction analysis in a Bragg-Brentano setup. Typically, a carrier material and an adhesion promoter are used. Instead, adhesive tapes can be used, combining the function of the carrier material and adhesion promoter. When selecting an adhesive tape, a priory knowledge of the background signal caused by the adhesive tape is not possible based solely on data sheets. Therefore, the X-ray diffraction behavior of commercially available adhesive film tapes for office and packing applications is studied. The diffractograms are provided in this data set. This enables XRD users to choose an adhesive tape for the top-dusted method best suiting their purpose. For the sake of comparison, the diffractograms of a deep well PMMA sample holder, a zero background sample holder (with and without vaseline as adhesion promoter), and a microscopy glass slide are provided.

The data correspond to a publication entitled : “Top dusted adhesive tape sample preparation method for the X-ray diffraction (XRD) analysis of small powder sample volumes with the Bragg-Brentano setup”.