Ultra-High-Pressure Annealing Data for Si/Mg/Mg+N-ion-implanted GaN for photoluminescence characterisation
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资源简介:
Boćkowski, Michał, 2026, "Ultra-High-Pressure Annealing Data for Si/Mg/Mg+N-ion-implanted GaN for photoluminescence characterisation", https://doi.org/10.18150/MBEOQH, RepOD, V1
创建时间:
2026-05-13



