Triboelectric ESD Dataset: Cryogenic RTD Interface Adapter Failure Population

Triboelectric ESD Dataset: Cryogenic RTD Interface Adapter Failure Population Title: Triboelectric Electrostatic Discharge Dataset — Precision Resistor Damage Population and Discharge Characterization in Cryogenic RTD Calibration Environments Authors: Michael Rusnack, BSE, ME Vice President, Science and Engineering PharmaWatch® • AmericanPharma Technologies • Boise, ID 83702 [e-mail] Jason Carnahan Manufacturing Design Engineer PharmaWatch® • AmericanPharma Technologies • Boise, ID 83702 Associated Publication: Rusnack, M., & Carnahan, J. (2026). Triboelectric Electrostatic Discharge as a Silent Source of Calibration Error in Cryogenic RTD Measurement Systems. Submitted to NCSL International 2026 Workshop & Symposium; manuscript under consideration, ASTM Journal of Testing and Evaluation. Dataset DOI: https://doi.org/10.5281/zenodo.20360156 Date of Data Collection: 30 Apr 2026 Geographic Location: Boise, Idaho, USA Dataset Description This dataset contains field evidence and experimental characterization data supporting the identification and analysis of a previously undocumented triboelectric electrostatic discharge failure mechanism in precision RTD interface adapter hardware deployed in bulk cryogenic calibration environments. The dataset comprises two primary components: component-level resistance measurements from approximately 50 returned adapter units, and oscilloscope waveform captures of triboelectric discharge events generated during a simulated bulk LN₂ RTD calibration workflow. The resistor population data provide field evidence for sub-threshold thin-film resistor damage induced by triboelectric discharge events during cryogenic calibration operations. The waveform captures provide empirical characterization of discharge voltage, morphology, and timing, directly validating the protection threshold gap hypothesis central to this study. File Contents ResistorMeasurements_Population.csv Component-level resistance measurements for all adapter units in the study population. Columns: Unit_ID, Deployment_Context, R7_kOhm, R8_kOhm, R9_kOhm, R10_kOhm, R11_kOhm, Damage_Assessment. Unit identifiers anonymized. Nominal values: R7 = R8 = 3.00 kΩ, R9 ≈ 1.62–1.65 kΩ, R10 = R11 = 2.20 kΩ, all at ±0.1% tolerance. Corresponds directly to Table 1 of the associated publication. ScopeCaptures_TriboelectricDischarge.pdf High-resolution oscilloscope waveform captures of triboelectric discharge events during simulated bulk LN₂ RTD calibration workflow. Contains three capture events: Figure 5a: Four-channel simultaneous capture, 100 ns/div, peak voltages 182–190 V across all interface lines Figure 5b: Single-channel capture, RTDSNS−, peak −292 V at 33.4 ns, 100 ns/div Figure 5c: Four-channel capture, 400 ns/div, full oscillatory decay, peak 166 V All captures include embedded cursor measurements, acquisition parameters (Tektronix, 2.50 GS/s, 1M-point acquisition), channel assignments, and timescale references. ElectrostaticFieldMeasurement.pdf Documentation of electrostatic field potential measurement at LN₂ dewar mouth with cable assemblies present. Measured surface potential: −1.43 kV. Instrument: SIMCO FMX-003 electrostatic field meter, calibration traceable to NIST. Measurement conditions and dewar configuration described. CalibrationTraceability.pdf Available calibration documentation for instrumentation used in experimental characterization, including oscilloscope and electrostatic field meter calibration references. Instrument identifiers retained; proprietary configuration details redacted where applicable. TestProtocol.pdf Description of bulk LN₂ calibration workflow as simulated during experimental characterization, including cable assembly specifications, dewar configuration, connection sequence, number of assemblies, and ambient environmental conditions during capture sessions. Variable Definitions — ResistorMeasurements_Population.csv Unit_ID: Anonymized unit identifier (Unit A through Unit O plus reference unit) Deployment_Context: Operational history category — Cal laboratory, Field monitoring, Passed acceptance test, or New unused reference R7_kOhm through R11_kOhm: Measured resistance in kilohms at time of return/evaluation. Precision LCR meter or resistance bridge measurement Damage_Assessment: Qualitative classification — No damage, Sub-threshold (shift %), Severe (shift factor ×N), or Catastrophic (shift factor ×N) R11_kOhm: Internal control resistor isolated from external interface. Nominal 2.20 kΩ in all units without exception Internal Control Note R11 is isolated from the external connector interface and is not in the triboelectric discharge path. Its invariance at nominal value across the entire unit population — including all calibration laboratory units with severe R7–R10 damage — is the forensic centerpiece of this dataset. Any alternative analysis of this dataset should account for this internal control observation before proposing alternative failure hypotheses. Damage Classification Reference Classification Resistance Deviation Example Units No damage Within ±0.1% nominal tolerance D, E, F, G, H, Reference Sub-threshold +4% to +10% above nominal I, K, L, N Severe ×15 to ×59 above nominal A, B, J, O Catastrophic ×200 to ×327 above nominal C, M Instrumentation Oscilloscope: Tektronix, 2.50 GS/s, 1M-point acquisition Electrostatic field meter: SIMCO FMX-003, calibration traceable to NIST Resistance measurement: Precision LCR meter or resistance bridge, calibration traceable to NIST Licensing This dataset is released under Creative Commons Attribution 4.0 International (CC BY 4.0). You are free to share and adapt the material for any purpose, provided appropriate credit is given to the authors and the associated publication is cited. Recommended Citation Rusnack, M., & Carnahan, J. (2026). Triboelectric ESD Dataset: Cryogenic RTD Interface Adapter Failure Population and Discharge Characterization Zenodo. https://doi.org/10.5281/zenodo.20360156 Acknowledgments Component-level resistance measurements were performed using instrumentation calibrated with traceability to the National Institute of Standards and Technology (NIST). Oscilloscope calibration and electrostatic field meter calibration references are documented in CalibrationTraceability.pdf. AI-assisted writing tools were used during README preparation solely to support language editing and structural refinement. All data, analyses, and interpretations are those of the authors.