Research Data supporting "Measuring the molecular origins of stiffness in organic semiconductors"
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The topographical data of Figure 1 were acquired using the tapping mode of a Park Systems NX10 AFM, while the nanomechanical measurements and the corresponding topographic analysis of Figure 3, 4, and 5, were performed using the QI (Quantitative Imaging) mode of a JPK AFM (NanoWizard®3 AFM, Bruker).
创建时间：
2025-12-02
