Data for "Non-contact and nanometer-scale measurement of PN junction depth buried in Si wafers using terahertz emission spectroscopy"
收藏Figshare2025-05-27 更新2026-04-28 收录
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https://figshare.com/articles/dataset/Data_for_Non-contact_and_nanometer-scale_measurement_of_PN_junction_depth_buried_in_Si_wafers_using_terahertz_emission_spectroscopy_/28766750
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资源简介：
Data set for paper titled "Non-contact and nanometer-scale measurement of PN junction depth buried in Si wafers using terahertz emission spectroscopy"
创建时间：
2025-05-27
